Correlation of test results and test coverage for an electronic device design

摘要

A device simulation system performs a set of tests by applying, for each test in the set, a corresponding test stimulus to a simulation of the electronic device. In response to each test stimulus, the simulation generates corresponding output information which the device simulation system compares to a specified expected outcome to identify a test result for that test stimulus. In addition, for each test stimulus, the device simulation system generates test coverage information indicating the particular configuration of the simulated electronic device that resulted from the stimulus. The device simulation system correlates the coverage information with the test results to identify correlation rules that indicate potential relationships between test results and configurations of the simulated device.