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Device for measuring the state of polarization of an incident wave of frequency 10 GHz to 30 THz

机译:用于测量10 GHz至30 THz频率的入射波的偏振状态的设备

摘要

The invention relates to a device (1) for measuring the state of polarization of an incident wave of frequency 10 GHz to 30 THz, comprising a field effect transistor (2), a reception antenna (3). According to the invention, the antenna parts (31, 33) detect a component of polarization of the wave, collinear with a direction (X) causing in the transistor (2) an alternating detection voltage (Us), the parts (32, 33) detect a component of polarization of the wave, collinear with a direction (Y) causing the appearance in the transistor (2) of an alternating detection voltage (Ud), the transistor (2) being designed to generate, as electrical detection signal (ΔU) between the source terminal (21) and the drain terminal (22), a DC detection voltage (ΔU) a part of which is determined by the state of elliptical polarization of the wave by interference in the transistor (2) between the alternating voltages (Us, Ud).
机译:本发明涉及一种用于测量频率为10 GHz至30 THz的入射波的极化状态的装置( 1 ),其包括场效应晶体管( 2 ),接收天线( 3 )。根据本发明,天线部分( 31、33 )检测波的极化分量,该极化分量与在晶体管( 2 )中引起的方向(X)共线。交流检测电压(Us),部分( 32、33 )检测波的极化分量,该极化分量与导致在晶体管中出现的方向(Y)共线( 2 < / B>)作为交流检测电压(Ud)的晶体管( 2 )设计为在源极端( 21 )之间生成电检测信号(ΔU) )和漏极端子( 22 ),其直流检测电压(ΔU)的一部分取决于晶体管( 2 )之间的交流电压(Us,Ud)。

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