methods to investigate a sample by means of lichtblatt - microscopy and lichtblatt microscope

摘要

the invention relates to a method for examining a sample by means of lichtblatt - microscopybut in a beleuchtungsebene probenfläche which by means of a in the beleuchtungsebene spreading lichtblattes lit and of the beleuchtungsebene outgoing detektionslicht is detected.the method is characterised bya position of a lichtblattfokus of lichtblattes in the beleuchtungsebene (26) by changing the optical length of the lichtweges of the lichtblatt plastic beleuchtungslichtes moved.