首页> 外国专利> X-RAY COMPUTED TOMOGRAPHY DEVICE AND METHOD FOR CONTROLLING FOCAL POINT POSITION IN X-RAY COMPUTED TOMOGRAPHY DEVICE

X-RAY COMPUTED TOMOGRAPHY DEVICE AND METHOD FOR CONTROLLING FOCAL POINT POSITION IN X-RAY COMPUTED TOMOGRAPHY DEVICE

机译:X射线计算机断层摄影设备及控制x射线计算机断层摄影设备中的焦点位置的方法

摘要

In order to appropriately detect an x-ray focal point position even when the x-ray focal point position moves due to heat, provided is an x-ray computed tomography device that comprises a slit member 110 wherein a small hole through which x-rays from an x-ray tube device 101 passes is formed, a detector for measuring focal point position 111 that detects the position of the focal point of the x-rays, and a control unit 108, wherein the detector for measuring focal point position 111 detects the amount of x-rays incident in each of a plurality of detection regions 111a, 111b, and the control unit 108 finds the amount of displacement of the x-ray focal point position with respect to an x-ray focal point reference position by comparing the detected values for the plurality of detection regions 111a, 111b and varies the relative positions of the slit member 110 and the detection regions 111a, 111b of the detector for measuring focal point position 111.
机译:为了即使当X射线焦点位置由于热而移动时也能够适当地检测X射线焦点位置,提供了一种X射线计算机断层摄影装置,该X射线计算机断层摄影装置包括狭缝构件110,狭缝构件110中具有供X射线通过的小孔。形成从X射线管装置101通过的装置,用于检测X射线的焦点位置的焦点位置测量用检测器111,以及用于测量焦点位置111的检测器的控制单元108在多个检测区域111a,111b中的每一个中入射的x射线量,并且控制单元108通过比较来找到x射线焦点位置相对于x射线焦点基准位置的位移量。多个检测区域111a,111b的检测值改变狭缝部件110与用于测量焦点位置111的检测器的检测区域111a,111b的相对位置。

著录项

  • 公开/公告号WO2017047275A1

    专利类型

  • 公开/公告日2017-03-23

    原文格式PDF

  • 申请/专利权人 HITACHI LTD.;

    申请/专利号WO2016JP73065

  • 发明设计人 OGAWAMINA;

    申请日2016-08-05

  • 分类号A61B6/03;

  • 国家 WO

  • 入库时间 2022-08-21 13:31:41

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