INTERFEROMETRIC METHOD OF MEASURING A REFLECTION COEFFICIENT

摘要

The invention can be used for measuring the reflection coefficient of nonlinear microwave devices. The technical result is the possibility of separately analyzing microwave devices on the base frequency and the frequencies of the upper harmonics of a signal fed to the input of said devices, since signals reflected from the microwave devices under analysis can be subjected to frequency selection using 6-port measuring reflectometers. For measuring purposes, 6-port measuring reflectometers are used. A probe signal, the frequency of which is adjusted within a given frequency range, is fed to a microwave device under analysis. Using a 6-port measuring reflectometer, 4 combinations of the probe signal and a signal reflected from the device under analysis are identified, whereupon said combinations are summed with a reference signal, the phase of which is dependent upon the frequency of the probe signal. The amplitudes of the variable components of the four resulting signal sums are found, whereupon, using said signals as information signals of the 6-port reflectometer, the coefficient of reflection from the device under analysis is calculated within a given frequency range.