METHOD AND DEVICE FOR CALIBRATING STRUCTURED-LIGHT THREE-DIMENSIONAL SCANNING SYSTEM

摘要

A method and device for calibrating a structured-light three-dimensional scanning system. The method comprises: scanning a calibration plane according to initial calibration parameters to obtain three-dimensional point cloud data of the calibration plane, wherein the calibration plane is provided with a plurality of uniformly distributed marking points (101); and finding an optimal calibration parameter according to the relationships between each of a first index, a second index and a third index and the calibration parameters (102), wherein the first index is an average value for the difference between a distance between each two adjacent marking points, calculated according to the three-dimensional point cloud data corresponding to the marking points, and the actual distance; the second index is an average value for the difference between an included angle between two straight lines formed by each marking point and two marking points adjacent thereto, calculated according to the three-dimensional point cloud data corresponding to the marking points, and the actual included angle; the third index is the difference between the flatness of the calibration plane, calculated according to the three-dimensional point cloud data of the calibration plate, and the actual flatness.