首页> 外国专利> MECHANICALLY ROBUST OPTICAL MEASUREMENT SYSTEM BY MEANS OF A LIGHT TIME-OF-FLIGHT MEASUREMENT AND/OR A REFLECTIVITY MEASUREMENT

MECHANICALLY ROBUST OPTICAL MEASUREMENT SYSTEM BY MEANS OF A LIGHT TIME-OF-FLIGHT MEASUREMENT AND/OR A REFLECTIVITY MEASUREMENT

机译:通过光飞行时间测量和/或反射率测量的手段进行的机械鲁棒光学测量系统

摘要

The invention relates to a measurement system and a measurement method for measuring test objects and/or arrangements of test objects, in particular of three-dimensional test objects and/or arrangements of test objects. The optical measurement system comprises at least one light source for emitting a transmission beam (30), a scanning or angle deflecting apparatus for scanning a test object (3) with the transmission beam (50) along two scanning axes, a reception device for detecting at least some of the transmission beam light (51) that was reflected and/or scattered by the test object and for generating at least one reception signal, wherein the reception device comprises at least one detector or one detector array (9); a tracking apparatus for tracking the transmission beam light (51) that was reflected and/or scattered by the test object (3) in the direction of the reception device, wherein the first of the two scanning axis is tracked optically and the second scanning axes is tracked electronically; and a signal processing device for processing the at least one reception signal in order to obtain information about the distance to individual measurement points of the test object (3) and/or about the reflectivity at individual measurement points of the test object (3). The tracking apparatus comprises a transmissive optical beam deflection arrangement (4, 5) which is designed to deflect in a synchronous manner with the scanning process along the first scanning axis the transmission beam light (51) that was reflected and/or scattered by the test object (3) in the direction of the reception device; and an imaging optical element (7), which is designed to image the light that propagated through the beam deflection arrangement (4, 5) onto the detector or the detector array (9). The tracking apparatus is further designed to switch different portions of the detector or of the detector array (9) in a synchronous manner with the scanning process along the second scanning axis, wherein the respectively switched portion is signal-connected to the signal processing device.
机译:本发明涉及一种用于测量测试对象和/或测试对象的布置,特别是三维测试对象和/或测试对象的布置的测量系统和测量方法。该光学测量系统包括至少一个用于发射透射光束(30)的光源,用于沿着两个扫描轴用透射光束(50)扫描测试对象(3)的扫描或角度偏转装置,用于检测的接收装置被测试物体反射和/或散射的至少一部分透射光束光(51),用于产生至少一个接收信号,其中,接收装置包括至少一个检测器或一个检测器阵列(9);跟踪装置,用于跟踪被检体(3)在接收装置的方向上反射和/或散射的透射光束(51),其中两个扫描轴中的第一个光学跟踪,第二个扫描轴电子跟踪;一种信号处理装置,用于处理至少一个接收信号,以便获得关于到测试对象(3)的各个测量点的距离和/或关于测试对象(3)的各个测量点的反射率的信息。跟踪设备包括透射光束偏转装置(4、5),其设计成与扫描过程同步地沿着第一扫描轴偏转被测试反射和/或散射的透射光束(51)。在接收设备方向上的物体(3);成像光学元件(7),其被设计成将通过光束偏转装置(4、5)传播的光成像到检测器或检测器阵列(9)上。跟踪设备还被设计为与沿着第二扫描轴的扫描过程同步地切换检测器或检测器阵列(9)的不同部分,其中,分别切换的部分被信号连接到信号处理装置。

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