首页> 外国专利> PREPROCESSING METHOD AND SYSTEM FOR HIGH PRECISE ANALYSIS OF METAL IMPURITIES IN POWDER

PREPROCESSING METHOD AND SYSTEM FOR HIGH PRECISE ANALYSIS OF METAL IMPURITIES IN POWDER

机译:粉末中金属杂质高精度分析的预处理方法和系统

摘要

The present invention relates to a preprocessing method and a system for the high precise analysis of metal impurities in powder. A plurality of magnets (11), having the N pole (11a) and the S pole (11b), are connected in parallel with each other. Parts of adjacent magnets (11), touching each other, comprise the same pole. A bipolar surface (10a), on which the N pole (11a) and the S pole (11b) are placed, are larger than an orthogonal surface (10b) placed in an orthogonal direction to the bipolar surface (10a). A yoke (14) is installed between the cent magnets (11). A heatproof coating layer (13) formed on the outer surface. A magnetic stick (10), including a floor separation member (12) installed at both ends, is mixed with powder to maximally attach metal impurities (21) and then dissolve the impurities in an acidic solution. Therefore, the present invention is capable of conducting high precision analysis by ppb unit by using an ICP analyzing device.;COPYRIGHT KIPO 2016
机译:本发明涉及一种用于高精度分析粉末中金属杂质的预处理方法和系统。具有N极(11a)和S极(11b)的多个磁体(11)彼此并联连接。彼此相邻的磁体(11)的一部分包括相同的磁极。放置有N极(11a)和S极(11b)的双极性表面(10a)大于在与双极性表面(10a)正交的方向上放置的正交表面(10b)。轭(14)安装在分磁铁(11)之间。在外表面上形成有耐热涂层(13)。将包括两端安装有地板分离构件(12)的磁棒(10)与粉末混合,以最大程度地附着金属杂质(21),然后将杂质溶解在酸性溶液中。因此,本发明能够通过使用ICP分析装置以ppb为单位进行高精度的分析。COPYRIGHTKIPO 2016

著录项

  • 公开/公告号KR20160131398A

    专利类型

  • 公开/公告日2016-11-16

    原文格式PDF

  • 申请/专利权人 LEE SANG IK;

    申请/专利号KR20150063699

  • 发明设计人 LEE SANG IKKR;

    申请日2015-05-07

  • 分类号G01N1/00;B03C1/00;G01N1/10;G01N1/38;G01N1/44;G01N21/73;G01N27/62;

  • 国家 KR

  • 入库时间 2022-08-21 13:29:03

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