METHOD OF PROGRAMMING ONE-TIME PROGRAMMABLE OTP MEMORY DEVICE AND METHOD OF TESTING SEMICONDUCTOR INTEGRATED CIRCUIT INCLUDING THE SAME

摘要

A program command is transferred from a tester to a semiconductor integrated circuit including a one-time programmable (OTP) memory device. In the OTP memory device, a program and a programming verification are performed with respect to OTP memory cells of the OTP memory device in response to the program command. The OTP device generates accumulated verification result signal by accumulating program verification results with respect to the OTP memory cells. The accumulated verification result signal is transferred from the OTP memory device to the tester. A reprogram of the OPT memory device is determined based on the accumulated verification result signal. The test time of the semiconductor integrated circuit including a one-time programmable (OTP) memory device may be reduced by providing the accumulated verification result to the tester.