1 2 PRIMARY AND SECONDARY SCANNING IN MUON TOMOGRAPHY INSPECTION

摘要

Techniques and systems are disclosed that use cosmic ray generating muons to inspect objects based on additional scanning of objects determined to potentially include one or more suspicious areas by initial scanning and initial scanning of all objects. In one embodiment, the system includes a primary scanner that performs initial or primary scanning to provide efficient and accurate inspection of objects while maintaining the desired throughput of inspection, and a smaller secondary scanner for additional or secondary scanning . In other implementations, a single scanner may be used to perform both initial scanning and additional scanning while maintaining sufficient throughput of lines of objects under inspection.