APPARATUS FOR MEASURING COEFFICIENT OF SURFACE MOISTURE OF DIELECTRIC SUBSTANCE USING VERY LOW FREQUENCY AND MICROWAVE

摘要

The present invention relates to an apparatus for measuring coefficient of surface moisture of a dielectric substance using a very low frequency and a microwave and, more specifically, to an apparatus comprising: a measured signal modulation unit modulating the microwave at the very low frequency (VLF); a measured signal output unit outputting the modulated measured signal; a surface moisture coefficient measuring sensor for discharging the measured signal output by the measured signal output unit to the dielectric substance (fine aggregate) via a transmission (TX) sensor probe and receiving a detected signal, passed through the dielectric substance (fine aggregate) to be exited, via a receiving (RX) sensor probe; an analog circuit unit comparing the measured signal, applied to the dielectric substance (fine aggregate), with the detected signal, passed through the dielectric substance (fine aggregate) to be excited, and measuring the coefficient of surface moisture; and a control circuit unit connected to the analog circuit unit and controlling the measured coefficient of surface moisture of the dielectric substance (fine aggregate). The sensor sensing the coefficient of surface moisture is installed directly in a fine aggregate storage bin and comes into direct contact with the fine aggregate stored in the fine aggregate storage bin, thereby being high frequency coated to maintain wear resistance and being exchangeable.;COPYRIGHT KIPO 2017