METHOD FOR ANALYZING INCLUSION IN MOLTEN STEEL AND METHOD FOR MANUFACTURING HIGH CLEAN MOLTEN STEEL FOR STEEL WIRE ROD

摘要

It is an object of the present invention to provide a method for analyzing inclusions contained in molten steel rapidly and precisely, and a method for producing a highly purified steel for wire using the same. According to the present invention, there is provided a method of manufacturing a semiconductor device, comprising: preparing a reference sample including a plurality of inclusions by the size of an inclusion; Preparing the reference sample for each type of inclusion; Measuring the optical intensity of each element by the emission spectroscopy on the prepared reference samples and obtaining the relationship between the light intensity and the inclusion size of each element; Preparing a steel sample by collecting molten steel in a steelmaking process; Measuring luminous intensity of each of the inclusions and elements contained in the steel sample by emission spectroscopic analysis of the steel sample; And determining the magnitude of the inclusions contained in the steel sample by substituting the light intensity of each element measured for the steel sample into the relationship between the light intensity and the inclusion size of each element with respect to the reference sample, And a method for manufacturing a high-clean steel for wire rod using the same. INDUSTRIAL APPLICABILITY According to the present invention, inclusions contained in molten steel can be analyzed quickly and precisely, and high-purity steel for wire rods can be manufactured using the results of such analysis