首页> 外国专利> 3 Method for 3D shape measuring using of Triple Frequency Pattern

3 Method for 3D shape measuring using of Triple Frequency Pattern

机译:3使用三频图样进行3D形状测量的方法

摘要

The present invention relates to a three-dimensional shape measuring method using a triple frequency pattern, in which at least one projector irradiates an inspection object with a pattern illumination, and then a three-dimensional shape A three-dimensional shape measuring method using a triple frequency pattern performed by a measuring apparatus, comprising: generating first to third reference pattern data having different periods; The first to third reference pattern data corresponding to the loaded first to third reference pattern data are loaded on the surface of the inspected object,; Capturing a plurality of first to third pattern images by photographing a surface of the inspection object irradiated with the first to third reference pattern lights from at least one camera; Selecting two pattern images having different periods from the first through third pattern images according to the measurement range of the inspection object; And calculating height information for the inspected object by extracting phase information from the selected two pattern images and calculating the phase-height equation. Accordingly, the present invention solves the ambiguity of 2 With respect to the inspection object having various heights, and simultaneously calculates the height information of the inspection object by selecting two pattern images having different periods according to the inspection area or property information of the inspection object The measurement accuracy can be improved and the inspection speed can be improved compared to the conventional method.;
机译:本发明涉及一种使用三频图案的三维形状测量方法,其中至少一个投影仪用图案照明照射检查对象,然后涉及三维形状。一种使用三频图案的三维形状测量方法。由测量设备执行的频率模式,包括:生成具有不同周期的第一至第三参考模式数据;以及与所加载的第一至第三参考图案数据相对应的第一至第三参考图案数据被加载在被检查物体的表面上;通过从至少一个照相机拍摄第一至第三参考图案光照射的检查对象的表面来捕获多个第一至第三图案图像;根据检查对象的测量范围从第一至第三图案图像中选择周期不同的两个图案图像;然后通过从所选的两个图案图像中提取相位信息并计算相位高度方程,来计算被检对象的高度信息。因此,本发明解决了对于具有各种高度的检查对象的2的歧义,并且通过根据检查区域或检查对象的特性信息选择具有不同周期的两个图案图像来同时计算检查对象的高度信息。与传统方法相比,可以提高测量精度,提高检查速度。

著录项

  • 公开/公告号KR101766468B1

    专利类型

  • 公开/公告日2017-08-09

    原文格式PDF

  • 申请/专利权人 주식회사 미르기술;

    申请/专利号KR20150123927

  • 发明设计人 박찬화;한영진;최경진;

    申请日2015-09-02

  • 分类号G01B11/25;G01B11/06;G06T7/00;

  • 国家 KR

  • 入库时间 2022-08-21 13:25:04

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号