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Fluorescent silicon nanoparticle for detecting copper ion method for preparing the same and ion detecting sensor using the same
Fluorescent silicon nanoparticle for detecting copper ion method for preparing the same and ion detecting sensor using the same
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机译:用于检测铜离子的荧光硅纳米粒子的制备方法以及使用该纳米粒子的离子检测传感器
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摘要
In one embodiment of the present invention, there is provided a method of manufacturing a semiconductor device, including: a first step of preparing a silicon wafer; a second step of etching the prepared silicon wafer; a third step of ultrasonically treating the etched silicon wafer to separate silicon nanoparticles; And a fourth step of hydrosilylating the surface of the particles with an organic compound containing a carbon-carbon double bond (C = C) at the end of the carbon chain to modify the surface of the silicon nanoparticle. And a method for producing the same.
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