首页> 外国专利> Fluorescent silicon nanoparticle for detecting copper ion method for preparing the same and ion detecting sensor using the same

Fluorescent silicon nanoparticle for detecting copper ion method for preparing the same and ion detecting sensor using the same

机译:用于检测铜离子的荧光硅纳米粒子的制备方法以及使用该纳米粒子的离子检测传感器

摘要

In one embodiment of the present invention, there is provided a method of manufacturing a semiconductor device, including: a first step of preparing a silicon wafer; a second step of etching the prepared silicon wafer; a third step of ultrasonically treating the etched silicon wafer to separate silicon nanoparticles; And a fourth step of hydrosilylating the surface of the particles with an organic compound containing a carbon-carbon double bond (C = C) at the end of the carbon chain to modify the surface of the silicon nanoparticle. And a method for producing the same.
机译:在本发明的一个实施例中,提供了一种制造半导体器件的方法,包括:制备硅晶片的第一步;第二步,对准备好的硅片进行刻蚀。超声处理蚀刻的硅晶片以分离硅纳米颗粒的第三步骤;第四步骤是用在碳链末端含有碳-碳双键(C = C)的有机化合物使颗粒的表面氢化以改性硅纳米颗粒的表面。及其生产方法。

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