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METHOD OF SELF-CALIBRATING A SAR A/D CONVERTER AND SAR-A/D CONVERTER IMPLEMENTING SAID METHOD

机译:SAR A / D转换器的自校准方法和SAR-A / D转换器实施方法

摘要

The present disclosure relates to a method of self-calibration of a SAR-A/D converter, comprising a N bit -bit digital-to-analog converter (DAC) for outputting a N bit -bit output code, said digital-to-analog converter (DAC) comprising a first subconverter (C MSB ) having a plurality N Th of thermometer elements T j (1) and a second subconverter (C LSB ) having a plurality of binary-weighted elements N Bin , said output code being defined by a thermometer scale S Th having a number of levels equal to 2 NBitTh +1. The method is characterized in that it comprises the steps of: - measuring, for each thermometer element of said plurality N Th of thermometer elements T j , an error value; - determining a mean value (µ) of these values; - dividing said plurality N Th of thermometer elements T j into a first subset (X) and a second subset (Y) each containing an identical number of values (x, y), equal to N Th /2, wherein said first subset (X) comprises the thermometer elements T j whose values are closer to said mean value (µ) as long as the error of the sum of thermometer elements T j of the first subset (X) is not worse than the error value of the element farthest from said mean value (µ) of said first subset (X) and said second subset (Y) comprising all the remaining thermometer elements T j ; - generating said thermometer scale, on the assumption that: - each level m i of said thermometer scale S Th , with i ranging from 0 to N Th /2, will be the incremental sum of each value (x) of said first ordered subset X; - each further level m i of said thermometer scale S Th , with i ranging from N Th /2+1 to N Th , will be the sum of all the values (y) of said second subset Y plus the incremental sum of the elements (x) of the subset X in any order; - generating said output code (OUTPUT) according to said thermometer scale S Th .
机译:本公开涉及一种SAR-A / D转换器的自校准方法,其包括用于输出N比特位输出代码的N比特位数模转换器(DAC),所述数模模拟转换器(DAC),其包括具有多个N Th温度计元件T j(1)的第一子转换器(C MSB)和具有多个二进制加权元件N Bin的第二子转换器(C LSB),所述输出代码被定义通过具有等于2 NBitTh +1的水平的温度计刻度S Th。该方法的特征在于它包括以下步骤:-为所述多个N Th个温度计元件T j中的每个温度计元件测量误差值;-确定这些值的平均值(μ);-将所述多个N Th个温度计元件T j分成第一子集(X)和第二子集(Y),每个子集包含相同数量的值(x,y),等于N Th / 2,其中,所述第一子集( X)包括温度计元件T j,只要第一子集(X)的温度计元件T j之和的误差不小于最远的元件的误差值,其值就更接近于所述平均值(μ)。从包括所有剩余温度计元件T j的所述第一子集(X)和所述第二子集(Y)的所述平均值(μ);-假设以下条件产生所述温度计刻度:-所述温度计刻度尺S Th的每个水平mi,i在0至N Th / 2之间,将是所述第一有序子集X的每个值(x)的增量和;-所述温度计刻度尺S Th的每个其他级别mi,其中i的范围为N Th / 2 + 1到N Th,将是所述第二子集Y的所有值(y)的总和加上元素的增量总和( x)子集X的任何顺序;-根据所述温度计刻度S Th产生所述输出代码(OUTPUT)。

著录项

  • 公开/公告号EP3026818B1

    专利类型

  • 公开/公告日2018-03-28

    原文格式PDF

  • 申请/专利权人 ST MICROELECTRONICS SRL;

    申请/专利号EP20150189321

  • 发明设计人 BURGIO CARMELO;GIACOMINI MAURO;

    申请日2015-10-12

  • 分类号H03M1/10;H03M1/46;H03M1/68;H03M1/80;

  • 国家 EP

  • 入库时间 2022-08-21 13:17:57

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