TEMPERATURE CHAMBER OF A LOAD DEVICE AS A PILLAR MATERIAL TESTING MACHINE AND METHOD FOR OPERATING SUCH A TEMPERATURE CHAMBER WITH AN ELEMENT FOR A BACKLIGHT

摘要

The present invention relates to a tempering chamber, which together with a loading device, such as. For example, a material testing machine of the column material testing machine type may enclose a material and / or component sample, it may also be said to enclose an optical measurement of the changes in the material and / or component sample under selected thermal and / or atmospheric conditions Ambient conditions can be measured. Thanks to a well-designed backlighting element, it is possible to realize a very space-saving tempering chamber.