METHOD FOR EVALUATION, METHOD FOR COMPOSITE EVALUATION, EVALUATION DEVICE, AND COMPOSITE EVALUATION DEVICE

摘要

PROBLEM TO BE SOLVED: To easily evaluate radiation noise of a semiconductor device and estimate radiation noise of a device to which the semiconductor device is equipped.SOLUTION: The present invention relates to an evaluation device and to a method for evaluation including the steps of: causing a semiconductor device to perform a switch operation, the semiconductor device being connected in parallel to a load by a load cable; measuring a common mode current flowing through a load cable during the switch operation; and outputting the evaluation index of the radiation noise on the basis of the common mode current.SELECTED DRAWING: Figure 3