MEASURING MACHINE ARRANGEMENT POSITION DETERMINATION DEVICE, MEASURING MACHINE ARRANGEMENT POSITION DETERMINATION METHOD, AND PROGRAM

摘要

PROBLEM TO BE SOLVED: To efficiently determine a measuring machine arrangement position, and to secure measurement quantity in the case of measuring an object to be measured by a measuring machine such as a laser scanner.;SOLUTION: A measuring machine arrangement position determination device for determining a measuring machine arrangement position for three-dimensionally measuring an object to be measured comprises: a base model reading part 11 for reading a base model of the object to be measured; a measurement part designation part 12 for designating the measurement part and significance of the object to be measured; a data interpolation part 13 for performing the interpolation processing of the base model; a voxel model generation part 14 for generating a voxel model from the base model; an arrangement position candidate designation part 15 for designating a measuring machine arrangement position candidate by using the voxel model; and an arrangement position determination part 16 for determining a measuring machine arrangement position. The arrangement position determination part 16 determines the measuring machine arrangement position by a method for performing arrangement position determination processing multiple times, and for selecting the position where the number of measurement requiring occupancy voxels to which a laser beam emitted from the measuring machine may be made incident becomes the maximum among measuring machine arrangement position candidates in each time arrangement position determination processing.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2018,JPO&INPIT