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Cr-Ti alloy sputtering target material and manufacturing method thereof

机译:Cr-Ti合金溅射靶材及其制造方法

摘要

Provided are: a Cr-Ti alloy sputtering target material, which is capable of suppressing the generation of fine particles during sputtering; and a method for producing this Cr-Ti alloy sputtering target material. A Cr-Ti alloy sputtering target material which is represented by composition formula Cr100-X-TiX (40 ≤ X ≤ 60) in terms of the atomic ratio, with the balance made up of unavoidable impurities that include Mg, Al, Si, Mn, Ni, Cu and Sn in an amount of from 1 ppm by mass to 50 ppm by mass (inclusive) in total. A method for producing a Cr-Ti alloy sputtering target material, wherein a Ti powder that contains, as impurities, Mg, Al, Si, Mn, Ni, Cu and Sn in an amount of from 1 ppm by mass to 50 ppm by mass (inclusive) in total and a Cr powder that contains, as impurities, Mg, Al, Si, Mn, Ni, Cu and Sn in an amount of from 1 ppm by mass to 50 ppm by mass (inclusive) in total are mixed with each other and sintered under pressure.
机译:本发明提供一种Cr-Ti合金溅射靶材,其能够抑制溅射时的微粒的产生。以及该Cr-Ti合金溅射靶材的制造方法。一种Cr-Ti合金溅射靶材料,其原子比由组成式Cr100-X-TiX(40≤X≤60)表示,其余部分由不可避免的杂质组成,包括Mg,Al,Si,Mn Ni,Cu和Sn的合计含量为1质量ppm〜50质量ppm(含)。一种Cr-Ti合金溅射靶材料的制造方法,其中,Ti粉含有1质量ppm〜50质量ppm的Mg,Al,Si,Mn,Ni,Cu和Sn作为杂质。总共混合(含)和Cr粉末,该Cr粉末中含有作为杂质的Mg,Al,Si,Mn,Ni,Cu和Sn的总量为1质量ppm至50质量ppm(包括端点)。彼此并在压力下烧结。

著录项

  • 公开/公告号JP6312009B2

    专利类型

  • 公开/公告日2018-04-18

    原文格式PDF

  • 申请/专利权人 日立金属株式会社;

    申请/专利号JP20160574745

  • 发明设计人 斉藤 和也;福岡 淳;坂巻 功一;

    申请日2016-02-02

  • 分类号C23C14/34;C22C1/04;C22C27/06;C22C14/00;G11B5/851;G11B5/738;

  • 国家 JP

  • 入库时间 2022-08-21 13:08:46

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