Method and apparatus for detecting tire defects in a tire manufacturing process

摘要

A method and an apparatus for detecting tire defects in a tire manufacturing process are disclosed. The method comprises the steps of obtaining a reference image (I (t)_refIncluding preparing (203) a sample tire to be analyzed, the method comprising: illuminating a surface portion of the sample tire with a tracking light source (204), wherein the illuminated surface of the sample tire Partial sample image (I_cmpAn edge is extracted from the reference image and the sample image (207), and an edge reference image (I (t)) including the edge included in the reference image_{ref_edg}), An edge sample image (I (t)) including an edge included in the sample image_{cmp_edg}), Respectively, and the edge reference image (I_{ref_edg}) (208), and based on this, the extended edge reference image (I_{ref_edg_dl}), Wherein the edge sample image (I_{cmp_edg}) As the extended edge reference image (I_{ref_edg_dl}) (Step 209), and calculates an edge image (I (k)) of a prospective defect including an edge which is included in the edge sample image and is not included in the extended edge reference image_{edg_pd}), And specifying the edge included in the edge image of the prospective defect as a prospective defect.