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Cache memory error detection circuit for detecting bit flip in valid indicator in cache memory after invalidation operation and related method and processor based system

机译:用于在无效操作之后检测高速缓冲存储器中的有效指示符的位翻转的高速缓冲存储器错误检测电路及相关方法和基于处理器的系统

摘要

Aspects disclosed herein include cache memory error detection circuits for detecting bit flips in valid indicators (e.g., valid bits) in cache memory following invalidate operations. Related methods and processor-based systems are also disclosed. If a cache hit results from access to a cache entry following an invalidate operation, a bit flip(s) has occurred in a valid indicator of the cache entry. This is because the valid indicator should indicate an invalid state following the invalidate operation of the cache entry, as opposed to a valid state. Thus, a cache memory error detection circuit is configured to determine if an invalidate operation was performed on the cache entry. The cache memory error detection circuit can cause a cache miss or an error for the accessed cache entry to be generated as a result, even though the valid indicator for the cache entry indicates a valid state due to the bit flip(s).
机译:本文公开的方面包括用于在无效操作之后检测高速缓冲存储器中的有效指示符(例如,有效位)中的位翻转的高速缓冲存储器错误检测电路。还公开了相关方法和基于处理器的系统。如果在无效操作之后访问缓存条目导致缓存命中,则在缓存条目的有效指示符中已发生位翻转。这是因为有效指示符应在高速缓存条目的无效操作之后指示无效状态,而不是有效状态。因此,高速缓存存储器错误检测电路被配置为确定是否对高速缓存条目执行了无效操作。高速缓存存储器错误检测电路可导致高速缓存未命中或作为结果生成所访问的高速缓存条目的错误,即使该高速缓存条目的有效指示符由于位翻转也指示有效状态。

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