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Method for high-resolution 3D-localization microscopy

机译:高分辨率3D定位显微镜的方法

摘要

A method for high-resolution 3D-localization microscopy of a sample having fluorescence emitters, in which the fluorescence emitters are excited to emit fluorescent radiation and the sample is displayed with spatial resolution in wide-field microscopy. Excitation is caused such that at least some fluorescence emitters are isolated. A three-dimensional localization is determined in a localization analysis, which includes a z-coordinate, x-coordinate as well as a y-coordinate orthogonal thereto, for each isolated fluorescence emitter. A table of localization imprecision is provided. Localization imprecision being determined for each localized fluorescence emitter by accessing the table of localization imprecision.
机译:一种用于具有荧光发射体的样品的高分辨率3D定位显微术的方法,其中激发荧光发射体以发出荧光辐射,并在宽视场显微镜中以空间分辨率显示样品。引起激发,使得至少一些荧光发射体被隔离。在定位分析中确定三维定位,其中包括每个隔离的荧光发射器的z坐标,x坐标以及与其正交的y坐标。提供了定位不精确度表。通过访问定位不精确度表,可以为每个定位的荧光发射器确定定位不精确度。

著录项

  • 公开/公告号US10031327B2

    专利类型

  • 公开/公告日2018-07-24

    原文格式PDF

  • 申请/专利权人 CARL ZEISS MICROSCOPY GMBH;

    申请/专利号US201314133169

  • 发明设计人 YAUHENI NOVIKAU;THOMAS KALKBRENNER;

    申请日2013-12-18

  • 分类号G02B21/16;G01N21/64;G02B21/36;G02B27/58;

  • 国家 US

  • 入库时间 2022-08-21 13:05:07

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