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DEFECT ANALYSIS DEVICE, DEFECT ANALYSIS SYSTEM, DEFECT ANALYSIS METHOD, AND COMPUTER READABLE RECORDING MEDIUM

机译:缺陷分析装置,缺陷分析系统,缺陷分析方法和计算机可读记录介质

摘要

To highly accurately determine whether there is a defect in a pipe.;A defect analysis device includes frequency determining means for determining a first frequency band based on a first vibration occurred at a first point located within a predetermined range from a deployment position of vibration detection means capable of detecting a vibration occurred at a pipe, determining a second frequency band based on a second vibration occurred at a second point located which is different from the first point, and determining a leakage frequency band based on the first frequency band and the second frequency band, and signal processing means for determining a defect between the first point and the second point based on a vibration level of the vibration in the leakage frequency band.
机译:为了高度准确地确定管道中是否存在缺陷。缺陷分析装置包括频率确定装置,该频率确定装置用于基于在从振动检测的展开位置起预定范围内的第一点处发生的第一振动来确定第一频带。能够检测在管道上发生的振动,基于在与第一点不同的第二点处发生的第二振动来确定第二频带,并基于第一频带和第二频带来确定泄漏频带的装置频带和信号处理装置,用于基于泄漏频带中的振动的振动水平来确定第一点和第二点之间的缺陷。

著录项

  • 公开/公告号US2018045687A1

    专利类型

  • 公开/公告日2018-02-15

    原文格式PDF

  • 申请/专利权人 NEC CORPORATION;

    申请/专利号US201615557535

  • 申请日2016-03-22

  • 分类号G01N29/34;G01M3/02;

  • 国家 US

  • 入库时间 2022-08-21 13:03:49

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