首页> 外国专利> ABNORMAL WAVEFORM SENSING SYSTEM, ABNORMAL WAVEFORM SENSING METHOD, AND WAVEFORM ANALYSIS DEVICE

ABNORMAL WAVEFORM SENSING SYSTEM, ABNORMAL WAVEFORM SENSING METHOD, AND WAVEFORM ANALYSIS DEVICE

机译:异常波形感测系统,异常波形感测方法及波形分析装置

摘要

The present invention includes acquiring an event point which is part of a reference waveform and which satisfies a predetermined condition, and extracting a singular point being part of the reference waveform in a period to which the acquired event point belongs, and has a value that indicates predetermined change, acquiring, when part of a target waveform corresponds to the event point, the part as a correspondence event point, and detecting a correspondence singular point in the period of the target waveform to which the correspondence event point belongs and corresponding to the singular point of the reference waveform, calculating a dissimilarity degree between a correction waveform generated based on the above four points and the reference waveform and the target waveform newly acquired, determining whether the target waveform has abnormality based on the dissimilarity degree, and outputting abnormality information.
机译:本发明包括:获取作为参考波形的一部分并且满足预定条件的事件点;以及在所获取的事件点所属的时段中提取作为参考波形的一部分的奇异点,并且该奇异点具有指示预定变化,在目标波形的一部分与事件点相对应时获取该部分作为对应事件点,并在对应事件点所属且与该奇异点对应的目标波形的周期内检测出对应奇点。参考波形的基准点,计算基于上述四个点生成的校正波形与新获取的基准波形和目标波形之间的相异度,并根据相异度判断目标波形是否具有异常,并输出异常信息。

著录项

  • 公开/公告号US2018260656A1

    专利类型

  • 公开/公告日2018-09-13

    原文格式PDF

  • 申请/专利权人 HITACHI LTD.;

    申请/专利号US201815903116

  • 发明设计人 KEIKO OHKUBO;TOSHIAKI SUZUKI;

    申请日2018-02-23

  • 分类号G06K9/62;G06F5/01;G06F17/18;

  • 国家 US

  • 入库时间 2022-08-21 13:02:08

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