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VANISHING VIA FOR HARDWARE IP PROTECTION FROM REVERSE ENGINEERING

机译:通过逆向工程实现硬件保护的消失

摘要

A semiconductor device can include a first metal trace, a first via disposed on the first metal trace, a second metal trace disposed on the first via, and an insulator interposed between the first metal trace and the first via. The insulator can be configured to lower an energy barrier or redistribute structure defects or charge carriers, such that the first metal trace and the first via are electrically connected to each other when power is applied. The semiconductor device can further include a dummy via disposed on the first metal trace.
机译:半导体器件可以包括第一金属迹线,设置在第一金属迹线上的第一通孔,设置在第一通孔上的第二金属迹线以及介于第一金属迹线和第一通孔之间的绝缘体。绝缘体可以被配置为降低能垒或重新分布结构缺陷或电荷载流子,使得当施加电力时,第一金属迹线和第一通孔彼此电连接。半导体器件可以进一步包括设置在第一金属迹线上的伪通孔。

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