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Method for closed loop testing of ASICs with image sensors in emulation

机译:在仿真中使用图像传感器对ASIC进行闭环测试的方法

摘要

A system, method, and computer program product for dynamic closed loop testing of an emulated ASIC interfaced to a sensor device. An adapter adjusts non-pre-recorded active sensor device data to be readable by an emulated ASIC design by adjusting data rates and performing formatting per a selected compatible interface. The adapter also adjusts control commands generated by the emulated ASIC design, including those generated in response to received and evaluated sensor device data, to be readable by the sensor device. The control commands dynamically cause changes in the data the sensor device subsequently outputs. Exemplary sensor devices include cameras that generate multimedia data in consumer electronics devices.
机译:一种系统,方法和计算机程序产品,用于对连接到传感器设备的仿真ASIC进行动态闭环测试。适配器通过调整数据速率并按选定的兼容接口执行格式化,来调整非预记录的有源传感器设备数据,以使其可被仿真ASIC设计读取。适配器还调整由仿真ASIC设计生成的控制命令,包括响应于接收和评估的传感器设备数据而生成的控制命令,以使传感器设备可以读取。控制命令动态地导致传感器设备随后输出的数据发生变化。示例性传感器设备包括在消费电子设备中生成多媒体数据的相机。

著录项

  • 公开/公告号US9946831B1

    专利类型

  • 公开/公告日2018-04-17

    原文格式PDF

  • 申请/专利权人 CADENCE DESIGN SYSTEMS INC.;

    申请/专利号US201514793671

  • 发明设计人 GAVIN WALTER ZAWALSKI;WENYONG HUANG;

    申请日2015-07-07

  • 分类号G06F17/50;

  • 国家 US

  • 入库时间 2022-08-21 12:59:11

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