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Method of inspecting RAM of programmable logic controller, and programmable logic controller

机译:可编程逻辑控制器的ram的检查方法及可编程逻辑控制器

摘要

A method of inspecting a RAM of a programmable logic controller is provided that enables all unit storage regions in a RAM inspection region to be inspected in about several minutes and that meets a predetermined safety standard. The inspection method includes the steps of: (a) dividing a RAM inspection region, which is a region of the RAM to be inspected, into a plurality of blocks; and (b) by a control device, writing a predetermined value into unit storage regions in a combination of blocks obtained by combining two blocks extracted from the divided blocks and thereafter sequentially inspecting whether or not values read from the unit storage regions each coincide with the written value. Step (b) is executed for all combinations of two blocks extracted from the divided blocks.
机译:提供一种检查可编程逻辑控制器的RAM的方法,该方法使得能够在大约几分钟内检查RAM检查区域中的所有单元存储区域并且满足预定的安全标准。该检查方法包括以下步骤:(a)将作为要检查的RAM的区域的RAM检查区域划分为多个块; (b)通过控制装置,将组合从分割后的块中提取出的两个块而得到的块的组合中的预定值写入到单位存储区域中,然后依次检查从单位存储区域读取的值是否与存储单元一致。书面价值。对于从划分的块提取的两个块的所有组合执行步骤(b)。

著录项

  • 公开/公告号US9817384B2

    专利类型

  • 公开/公告日2017-11-14

    原文格式PDF

  • 申请/专利权人 JTEKT CORPORATION;

    申请/专利号US201514660106

  • 发明设计人 KENICHI IKEGAMI;

    申请日2015-03-17

  • 分类号G11C29/00;G05B19/05;G11C29/04;

  • 国家 US

  • 入库时间 2022-08-21 12:57:03

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