首页> 外国专利> Method for fabricating low resistance, low inductance interconnections in high current semiconductor devices

Method for fabricating low resistance, low inductance interconnections in high current semiconductor devices

机译:在大电流半导体器件中制造低电阻,低电感互连的方法

摘要

A method for fabricating a low resistance, low inductance device for high current semiconductor flip-chip products. A structure is produced, which comprises a semiconductor chip with metallization traces, copper lines in contact with the traces, and copper bumps located in an orderly and repetitive arrangement on each line so that the bumps of one line are positioned about midway between the corresponding bumps of the neighboring lines. A substrate is provided which has elongated copper leads with first and second surfaces, the leads oriented at right angles to the lines. The first surface of each lead is connected to the corresponding bumps of alternating lines using solder elements. Finally, the assembly is encapsulated in molding compound so that the second lead surfaces remain un-encapsulated.
机译:一种用于大电流半导体倒装芯片产品的低电阻,低电感器件的制造方法。产生了一种结构,该结构包括具有金属化迹线的半导体芯片,与迹线接触的铜线以及在每条线上以有序且重复的布置定位的铜凸块,从而一条线的凸块位于相应凸块之间的中间位置。相邻的线。提供了一种基板,该基板具有带有第一和第二表面的细长铜引线,这些引线与线成直角。每个引线的第一表面使用焊料元素连接到交替线的相应凸块。最后,将组件封装在模塑料中,以使第二引线表面保持未封装状态。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号