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СПОСІБ ПАСИВАЦІЇ ПОВЕРХНІ ПОРУВАТОГО ФОСФІДУ ІНДІЮ

机译:粉末状印度粉末的表面钝化方法

摘要

A useful model relates to the methods of processing the surface of porous phosphide of indium n-type, namely, the passivation of sulfur, resulting in the crystal surface becomes resistant to the appearance of oxides. Ideally, the surface or partition boundary is a barrier that clearly separates the internal areas of the device or sets its outer boundaries. The surface of most semiconductors A3B5 is characterized by a high density of surface states in the forbidden zone, which leads to the fixing of the Fermi level, whose position on the surface practically does not depend on the nature of the adsorbed atoms. This circumstance adversely affects the work of many micro and optoelectronic devices, preventing them from fully disclosing the high potentialities of these semiconductors. The basis of the useful model is the problem of studying the influence of chalcogenide passivation of sulfur surface on porous layers of phosphide indium on the stability of properties, that is, passivation of sulfur to the state of inertia in relation to oxygen.
机译:一种有用的模型涉及处理n型铟的多孔磷化物的表面的方法,即硫的钝化,从而使晶体表面变得抗氧化物的出现。理想情况下,表面或分隔边界是清楚地分隔设备内部区域或设置其外部边界的屏障。大多数半导体A3B5的表面的特征是在禁区中具有高密度的表面态,这导致费米能级的固定,费米能级在表面上的位置实际上不取决于吸附原子的性质。这种情况会对许多微型和光电设备的工作产生不利影响,从而阻止它们充分揭示这些半导体的高潜力。有用模型的基础是研究硫表面硫属元素钝化对磷化铟多孔层的影响,即硫钝化成相对于氧的惯性状态对性能稳定性的影响的问题。

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