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CURVATURE RADIUS MEASURER, ELECTRONIC DEVICE AND MANUFACTURING METHOD FOR CURVATURE RADIUS MEASURER

机译:曲率半径测量仪,曲率半径测量仪的电子装置及其制造方法

摘要

A curvature radius measurer (100), an electronic device and a manufacturing method for the curvature radius measurer (100). The curvature radius measurer (100) is adhered to a required panel (200); when the panel (200) is pressed, the panel (200) can be bent and deformed, and strain sensing resistors (R1, R2, R3, R4) are deformed therewith, thus causing a change of an electrical property of a curvature radius measurement circuit (20), wherein the electrical property is only related to the curvature radius (r) of the panel (200); and the corresponding electric signal is obtained by means of the curvature radius measurement circuit (20), that is, the curvature radius (r) of the panel (200) at a pressed position can be accurately detected. The curvature radius measurer (100) can be easily manufactured and fitted, thereby avoiding the situation of inconvenient usage caused due to the need to place a measured member on an existing optical measurement instrument, can prevent interference caused by different glue adhesive conditions, and has the characteristics of good stability and good repeatability. When the curvature radius (r) of the panel (200) is far greater than the thickness of a substrate (10), the detection is reliable, the substrate (10) can minimally reach 0.1 mm, and in a micro-deformation situation, the curvature radius (r) of the panel (200) is generally greater than 1000 mm. The curvature radius measurer (100) is applicable to detecting a micro-deformation.
机译:曲率半径测量器(100),电子设备和曲率半径测量器(100)的制造方法。曲率半径测量器(100)粘附到所需面板(200)上;当按压面板(200)时,面板(200)会弯曲和变形,并且应变感测电阻器(R1,R2,R3,R4)随之变形,从而引起曲率半径测量的电特性的变化。电路(20),其中电特性仅与面板(200)的曲率半径(r)有关;借助于曲率半径测量电路(20)获得相应的电信号,即,可以准确地检测出面板(200)在受压位置的曲率半径(r)。曲率半径测量仪(100)易于制造和安装,从而避免了由于需要将测量部件放置在现有的光学测量仪器上而引起的使用不便的情况,可以防止由于不同的胶粘条件而引起的干扰,并且具有稳定性好,重复性好的特点。当面板(200)的曲率半径(r)远大于基板(10)的厚度时,检测是可靠的,基板(10)可以最小达到0.1 mm,并且在微变形的情况下,面板(200)的曲率半径(r)通常大于1000mm。曲率半径测量器(100)适用于检测微变形。

著录项

  • 公开/公告号WO2017201721A1

    专利类型

  • 公开/公告日2017-11-30

    原文格式PDF

  • 申请/专利权人 SHENZHEN NEW DEGREE TECHNOLOGY CO.LTD.;

    申请/专利号WO2016CN83554

  • 发明设计人 LI HAO;HUANG TUOXIA;

    申请日2016-05-26

  • 分类号G01B7/293;G01L9/02;

  • 国家 WO

  • 入库时间 2022-08-21 12:47:02

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