首页>
外国专利>
MEASURING METHOD AND DEVICE FOR INSULATOR SURFACE EQUIVALENT SALT DEPOSIT DENSITY
MEASURING METHOD AND DEVICE FOR INSULATOR SURFACE EQUIVALENT SALT DEPOSIT DENSITY
展开▼
机译:绝缘子等效盐沉积密度的测量方法和装置
展开▼
页面导航
摘要
著录项
相似文献
摘要
A measuring method and device for insulator surface equivalent salt deposit density. The measuring method comprises the following steps: S1, focusing a pulsed laser light source on a contaminated surface of an insulator to be detected, using the laser source to emit laser with a pulse width smaller than or equal to 20 ns to induce contamination substances on the surface of the insulator to form plasma, and acquiring spectral information emitted by the plasma in an expansion cooling process; S2, establishing a relation model between the density of ions in common soluble salts in contamination substances on the surface of the insulator and spectral features after the plasma is generated by means of excitation of the laser; S3, inputting the spectral information acquired in S1 into the relation model in S2, and performing analysis to obtain the ion composition of the contamination substances on the surface of the insulator to be detected and ion density of the ions; and S4, calculating the equivalent salt deposit density of the contamination substances according to the ion density of the ions. Without the need of sampling while power outage, the measuring method and device can implement online measurement of contamination components and the equivalent salt deposit density.
展开▼