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MEASURING METHOD AND DEVICE FOR INSULATOR SURFACE EQUIVALENT SALT DEPOSIT DENSITY

机译:绝缘子等效盐沉积密度的测量方法和装置

摘要

A measuring method and device for insulator surface equivalent salt deposit density. The measuring method comprises the following steps: S1, focusing a pulsed laser light source on a contaminated surface of an insulator to be detected, using the laser source to emit laser with a pulse width smaller than or equal to 20 ns to induce contamination substances on the surface of the insulator to form plasma, and acquiring spectral information emitted by the plasma in an expansion cooling process; S2, establishing a relation model between the density of ions in common soluble salts in contamination substances on the surface of the insulator and spectral features after the plasma is generated by means of excitation of the laser; S3, inputting the spectral information acquired in S1 into the relation model in S2, and performing analysis to obtain the ion composition of the contamination substances on the surface of the insulator to be detected and ion density of the ions; and S4, calculating the equivalent salt deposit density of the contamination substances according to the ion density of the ions. Without the need of sampling while power outage, the measuring method and device can implement online measurement of contamination components and the equivalent salt deposit density.
机译:绝缘子表面等效盐沉积密度的测量方法和装置。该测量方法包括以下步骤:S1,将脉冲激光源聚焦在待检测绝缘体的受污染表面上,利用激光源发射脉冲宽度小于或等于20ns的激光,在其上诱发污染物质。绝缘体的表面形成等离子体,并在膨胀冷却过程中获取等离子体发射的光谱信息。 S2,建立绝缘子表面污染物中普通可溶性盐离子的密度与通过激光激发产生等离子体后的光谱特征之间的关系模型; S3,将S1中获取的光谱信息输入S2中的关系模型中,进行分析,得到待检测绝缘体表面上污染物质的离子组成和离子的离子密度; S4,根据离子的离子密度,计算污染物质的当量盐析出密度。该测量方法和设备无需在停电时进行采样,就可以在线测量污染成分和等效盐沉积密度。

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