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DEVICE AND METHOD FOR DETERMINING THE PINPOINT-ABILITY OF POTENTIAL ERRORS OF ONE OR MORE COMPONENTS
DEVICE AND METHOD FOR DETERMINING THE PINPOINT-ABILITY OF POTENTIAL ERRORS OF ONE OR MORE COMPONENTS
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机译:用于确定一个或多个组件的潜在误差的定点能力的设备和方法
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摘要
The invention relates to a device (1) for determining whether a potential error (F11, F12, F13, F21, F22, F31, F41) of one or more components (K1, K2, K3, K4) can be clearly pinpointed on the basis of a result of predefined possible diagnoses (DM1, DM2, DM3), said device comprising: (a) a memory device (4) which is designed to store, in a matrix (20), parameters that, for each combination of a potential error (F11, F12, F13, F21, F22, F31, F41) of one of the components (K1, K2, K3, K4) and a possible diagnostic result, provide a measurement as to whether the error in question (F11, F12, F13, F21, F22, F31, F41) is possible when the respective diagnostic result occurs, wherein each row of the matrix (20) is associated with one of the possible diagnostic results, and each space of the matrix (20) is associated with one of the potential errors (F11, F12, F13, F21, F22, F31, F41); (b) a selection device (6) designed to select at least two rows of the matrix (20) that contain, for a diagnostic result consistent with an error being identified (F11, F12, F13, F21, F22, F31, F41), a parameter which is greater than a predefined first limit value; (c) a calculator device (8) designed to calculate a result vector by means of element-wise multiplication of the selected rows of the matrix (20); and (d) a determination device (10) designed to determine whether the result vector contains at least one element that is not less than a predefined second limit value, wherein the elements of the result vector that are less than the predefined second limit value are not greater than a predefined third limit value.
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