DAMAGE PREDICTION APPARATUS AND DAMAGE PREDICTION METHOD FOR POWER SEMICONDUCTOR SWITCHING ELEMENT, AC-DC CONVERTER, AND DC-DC CONVERTER

摘要

According to the present invention, a damage determination apparatus for a power semiconductor switching element is provided with: a resistor that is connected to the gate of the power semiconductor switching element; a comparison unit that compares a reference voltage with a detected voltage in accordance with the voltage generated at both ends of the resistor, when a prescribed voltage is applied to the gate of the power semiconductor switching element; and a prediction unit that predicts that a prescribed damage has accumulated in the gate insulating layer of the power semiconductor switching element when the detected voltage exceeds the reference voltage.