首页> 外国专利> Oxide transistor using femto-second laser preannealing and fabricating method thereof

Oxide transistor using femto-second laser preannealing and fabricating method thereof

机译:飞秒激光预退火的氧化物晶体管及其制造方法

摘要

The present invention relates to an oxide transistor and a method of manufacturing the same, and a method of manufacturing an oxide transistor according to the present invention includes the steps of: fabricating a substrate including a bottom electrode used as a gate electrode; And performing a preannealing process on a surface of the thin film using a femtosecond laser. After the pre-annealing process is performed, an active layer is formed on the substrate, And forming a top electrode used as a source and a drain on the active layer. According to the present invention, there is an effect that the performance of the oxide transistor can be improved.
机译:本发明涉及一种氧化物晶体管及其制造方法,以及根据本发明的氧化物晶体管的制造方法,包括以下步骤:制造包括用作栅电极的底部电极的基板;并且使用飞秒激光在薄膜的表面上执行预退火工艺。在执行预退火工艺之后,在基板上形成有源层,并且在有源层上形成用作源极和漏极的顶部电极。根据本发明,具有可以提高氧化物晶体管的性能的效果。

著录项

  • 公开/公告号KR101859621B1

    专利类型

  • 公开/公告日2018-05-18

    原文格式PDF

  • 申请/专利权人 충북대학교 산학협력단;

    申请/专利号KR20160108285

  • 发明设计人 김성진;김원유;엄주송;선비;

    申请日2016-08-25

  • 分类号H01L27/12;G02F1/1368;H01L21/02;H01L21/324;H01L29/786;

  • 国家 KR

  • 入库时间 2022-08-21 12:37:47

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