首页> 外国专利> 2 2-D PRECISION MEASURING SYSTEM USING INTERFEROMETER AND VISION

2 2-D PRECISION MEASURING SYSTEM USING INTERFEROMETER AND VISION

机译:2使用干涉仪和视觉的二维精度测量系统

摘要

The present invention relates to a precise measurement system, which comprises: an interferometer measuring a distance of a movable object; a plurality of imaging devices fixed to certain positions, different from each other, and photographing images of an object located in a certain range; a plurality of reference position providers coming in contact with the object and providing a reference position for measurement; and a control apparatus calculating an absolute coordinate for presenting a distance from each reference point of the plurality of reference position providers to each pixel of a plurality of images obtained from the plurality of imaging devices based on the distance measured by the interferometer and the images obtained by the plurality of imaging devices, calculating an absolute distance between the pixels of the images based on the absolute coordinate, and measuring a length of the object photographed by the imaging devices by using the absolute coordinate or the absolute distance.
机译:精密测量系统技术领域本发明涉及一种精密测量系统,其包括:干涉仪,其测量可移动物体的距离;以及多个成像装置固定在彼此不同的特定位置,并且拍摄位于一定范围内的物体的图像;多个参考位置提供器与物体接触并提供用于测量的参考位置;以及控制装置,其基于干涉仪测量的距离和所获得的图像,计算用于表示从所述多个参考位置提供者的每个参考点到从所述多个成像装置获得的多个图像的每个像素的距离的绝对坐标。通过多个成像装置,基于绝对坐标计算图像的像素之间的绝对距离,并通过使用绝对坐标或绝对距离来测量由成像装置拍摄的对象的长度。

著录项

  • 公开/公告号KR101889746B1

    专利类型

  • 公开/公告日2018-08-20

    原文格式PDF

  • 申请/专利权人 XL PHOTONICS INC.;

    申请/专利号KR20170067946

  • 发明设计人 CHOO HEUNG RO;

    申请日2017-05-31

  • 分类号G01B11/02;G01B11;G01B9/02;G06T1;

  • 国家 KR

  • 入库时间 2022-08-21 12:37:18

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号