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SYSTEM AND THE METHOD FOR PRODUCING VERTICAL PROFILE OF ATMOSPHERIC TRACE GAS USING MULTIPLE WAVELENGTH
SYSTEM AND THE METHOD FOR PRODUCING VERTICAL PROFILE OF ATMOSPHERIC TRACE GAS USING MULTIPLE WAVELENGTH
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机译:利用多波长产生大气痕量气体垂直剖面的系统和方法
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摘要
The present invention relates to a multi-wavelength, multi-wavelength, multi-wavelength, multi-wavelength, multi-wavelength, multi- The present invention relates to a system for calculating a vertical profile of an in-atmosphere micro-gas using the method of the present invention. The atmospheric trace gas vertical profile calculation system using the multiple wavelengths generates simulated radiant luminance data by applying simulated trace gas vertical profiles and environment information on a pre-stored trace gas to the atmospheric radiation model, A simulated SCD-LUT generator 100 for deriving a simulated SCD from the data and generating a simulated SCD-LUT that matches a simulated SCD for each simulated trace gas vertical profiles; A multi-wavelength SCD measuring unit for deriving an observation SCD for a trace gas to be measured by measuring and adding the SCDs to the observed trace gas at different wavelengths by the DOAS using a fitting window of different wavelengths (200); And extracting a simulated SCD value coinciding with the observation SCD in a predetermined error range from the SCD-LUT and deriving a corresponding simulated trace gas vertical profile as a trajectory vertical profile of a target gas to be measured, (300). / RTI
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