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Translucent support for a semiconductive thin-film structure and method of making and using the translucent support

机译:用于半导体薄膜结构的半透明支撑物以及制备和使用该半透明支撑物的方法

摘要

Translucent support (01) for a semiconductive thin-film structure (14) comprising a superstrate (03) with a top (05) provided for incident light (04) and a bottom (06) on which a light trapping structure improving the optical properties of the superstrate (03) (02), to which the thin-film structure (14) can be connected, wherein the light-trapping structure (02) consists of at least one sub-micron three-dimensional structure layer (09) of silicon oxide on the superstrate (03), characterized in that the three-dimensional structural layer ( 09) are formed as a homogeneous silicon dioxide layer having a periodic nanostructure (07) with a period P between 200 nm and 1000 nm and a first antireflection layer (10) following the structure layer (09) as a nanocrystalline titanium oxide layer or as a tin oxide layer, wherein the first antireflection layer ( 10) the height HN of the nanostructure (07) of the structural layer (09) by at least 30%, the height HL of the light trapping structure (02) is between 20 nm and 200 nm and the angle W between the surfaces (13) of the light trapping structure (02) and the bottom surface (06) of the superstrate (03) is not greater than 60 ° and that a passivation layer (12) is arranged on the light capture structure (02), wherein a temperature stability of the carrier (01) for a liquid phase crystallization is given.
机译:用于半导体薄膜结构(14)的半透明支撑件(01),其包括覆板(03),该覆板(03)具有用于入射光(04)的顶部(05)和底部(06),在该底部上具有改善光学特性的光捕获结构可以在其上连接薄膜结构(14)的上层基板(03)(02)的一部分,其中光捕获结构(02)由至少一层的亚微米三维结构层(09)组成上覆层(03)上的氧化硅,其特征在于,三维结构层(09)形成为具有周期纳米结构(07)的均相二氧化硅层,周期纳米结构(07)的周期P在200nm至1000nm之间并且具有第一抗反射性结构层(09)之后的层(10)是纳米晶态的氧化钛层或氧化锡层,其中第一抗反射层(10)的高度为结构层(09)的纳米结构(07)的高度HN至少30%,即光捕获结构(02)的高度HL钝化层(20)在20nm和200nm之间,并且光捕获结构(02)的表面(13)和覆板(03)的底表面(06)之间的角度W不大于60°,并且钝化层(图12)布置在光捕获结构(02)上,其中给出了用于液相结晶的载体(01)的温度稳定性。

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