Surge test device for short-circuit tests of components of a high-voltage system and method

摘要

Surge current tester (100) for short-circuit testing of components of a high-voltage system, which is formed at a high voltage voltage of up to about 1000 V currents up to 20 kA at a current rise time of up to 500 A per 10 microseconds, in particular 1000 A per 10 μs, for a duration of up to 50 ms, with a first connection (106) and a second connection (108) for a test object (104), with a capacitor device (C1) connected to the two connections (106, 108) is electrically connected and which is arranged to provide a high-voltage voltage (U) at the terminals (106, 108), - with a number of additional capacitors (C2, C3, C4, C5, C6, C7, C8, C9, C10, C11), which are electrically connected in series with the capacitor device (C1), - with a control device (110) which is designed to monitor a voltage waveform of the high-voltage voltage (U) and another additional capacitor (C2 , C3, C4, C5, C6, C7, C8, C9, C10, C11) in addition in series, when the voltage waveform falls below a threshold (430), - each with a thyristor (Th2, Th3, Th4) per additional capacitor (C2, C3, C4, C5, C6, C7, C8, C9, C10, C11) and a thyristor (Th1) for the capacitor device (C1), wherein each one thyristor (Th1, Th2, Th3, Th4) in each case one electrode of the associated capacitor (C1, C2, C3, C4, C5, C6, C7, C8, C9, C10, C11) connects to the second terminal (108), - wherein the number of additional capacitors (C2, C3, C4, C5, C6, C7, C8, C9, C10 , C11) have an equal or decreasing capacitance in the order of their being connected, and in each case have a voltage between approximately 45 V and approximately 80 V, the voltage of the additional capacitors (C2, C3, C4, C5, C6, C7, C8 , C9, C10, C11) at the moment of connecting a difference between a setpoint output voltage (U) and a reference voltage (U) e representing the threshold value (430) orresponds.