A process for the contactless determination of a temperature as well as infrared - measuring system

摘要

The proposed method for contactless determination of a temperature of a surface (22), in particular for contactless determination of a temperature distribution of a surface (22), is based on a infrared - measuring system (10), the at least comprises: - an infrared detector array (36) with an array of detectors - substrate (72) and• with a plurality of measuring pixels (62), which are each provided with a first thermal conductivity λ_Mp (120) on the detector array - substrate (72) are attached, wherein the measurement pixel (62) are sensitive to infrared radiation, and in each case a measuring signal for determining a of an intensity of the incident infrared radiation dependent temperature measurement value t_Mp (66), and• with a plurality of reference pixels (64), which are each provided with a second thermal conductivity λ_Bp (122) on the detector array - substrate (72) are attached, and each of which a measurement signal for determining a temperature measurement value t_Bp (68) providing,and wherein said method includes at least the following steps:• Determining the measured temperature values t_Bp (68) of a plurality of reference pixels (64);• Determining the measured temperature values t_Mp (66) of a plurality of measuring pixels (62);• Correcting measurements t_Mp (66) in each case by one pixel - associated temperature - drift component t_drift (46).According to the invention, the subtractor d61 (64) than for infrared radiation in the substantially insensitive blind pixels is realized, wherein the second thermal conductivity λ_Bp (122) is greater than the first thermal conductivity λ_Mp (120) and the temperature - drift components t_drift (46) with the use of measurements t_Bp (68) are determined.Furthermore, a with the method of operating infrared - measuring system (10) is proposed.