首页> 外国专利> Method and apparatus for modifying imaging properties of an optical system for microlithography

Method and apparatus for modifying imaging properties of an optical system for microlithography

机译:修改用于微光刻的光学系统的成像特性的方法和设备

摘要

The invention relates to a method and an apparatus for modifying imaging properties of an optical system for microlithography. In a method according to the invention, the modification of the imaging properties is effected via control signals (A, B, C), which are coupled into the optical system via at least one interface, the values of these trigger signals coupled in each case for triggering a desired modification of the imaging properties being based on a Model are determined, and wherein this model is generated by the fact that in a learning phase, in which the respectively obtained for different values of the drive signals modification of the imaging properties is determined, a successive individual adaptation of the model takes place on the optical system.
机译:本发明涉及一种用于修改用于微光刻的光学系统的成像特性的方法和设备。在根据本发明的方法中,通过控制信号(A,B,C)实现成像特性的改变,所述控制信号经由至少一个接口耦合到光学系统中,这些触发信号的值在每种情况下都耦合基于模型确定用于触发成像特性的期望的修改,并且其中通过在学习阶段中生成以下模型,该模型在学习阶段中,分别针对驱动信号的不同值获得成像特性的修改。确定后,将在光学系统上对模型进行连续的个别调整。

著录项

  • 公开/公告号DE102016225899A1

    专利类型

  • 公开/公告日2018-06-21

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT GMBH;

    申请/专利号DE201610225899

  • 发明设计人 JOCHEN KNOPF;MOHAMMAD AWAD;

    申请日2016-12-21

  • 分类号G03F7/20;G02B7/185;

  • 国家 DE

  • 入库时间 2022-08-21 12:34:24

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号