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RADIATION DETECTOR AND METHOD FOR REDUCING THE AMOUNT OF TRAPPED CHARGE CARRIERS IN A RADIATION DETECTOR

机译:辐射检测器及减少辐射检测器中被困电荷载体量的方法

摘要

A semiconductor based photon counting detector comprising a substrate (11) of semiconductor material; a detector bias voltage supply (12) for applying a detector bias voltage over the substrate, each time during a data acquisition period (t1); a readout arrangement (13) for repetitively reading out data indicative of charges freed in, and transported through, the substrate (11) in response to photons being absorbed, each time during a readout period (t2) following a data acquisition period, wherein the data contain number of charge pulses of photons being absorbed; an external light source (15) for exposing the substrate for light to enable trapped charge carriers to escape from defect levels in the substrate; and a control device (14) operatively connected to the detector bias voltage supply, the readout arrangement, and the external light source. The control device (14) is configured to control the detector bias voltage supply to switch off the detector bias voltage over the substrate and the external light source (15) to switch on the light, thus exposing the substrate (11) for light to enable trapped charge carriers to escape from defect levels in the substrate, concurrently during at least some of said readout periods.
机译:一种基于半导体的光子计数检测器,包括半导体材料的基板(11);检测器偏压电源(12),用于在数据采集周期(t1)中的每一次在基板上施加检测器偏压。读出装置(13),用于在每次数据采集周期之后的读出周期(t2)中,每次响应于吸收光子而重复读出指示释放并穿过基板(11)的电荷的数据。数据包含被吸收的光子的充电脉冲数;外部光源(15),用于使基板暴露于光中,以使捕获的电荷载流子从基板中的缺陷能级逸出;控制装置(14)可操作地连接到检测器偏置电压源,读出装置和外部光源。控制装置(14)被配置为控制检测器偏置电压供应以关闭基板上的检测器偏置电压,并控制外部光源(15)以开启光,从而使基板(11)暴露于光以使能在至少一些所述读出周期期间,被捕获的电荷载流子同时逃逸出衬底中的缺陷水平。

著录项

  • 公开/公告号EP3108267B1

    专利类型

  • 公开/公告日2019-09-25

    原文格式PDF

  • 申请/专利权人 XCOUNTER AB;

    申请/专利号EP20150752066

  • 申请日2015-02-20

  • 分类号G01T1/24;

  • 国家 EP

  • 入库时间 2022-08-21 12:31:36

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