首页> 外国专利> OBJECT POSITION INDEPENDENT METHOD TO MEASURE THE THICKNESS OF COATINGS DEPOSITED ON CURVED OBJECTS MOVING AT HIGH RATES

OBJECT POSITION INDEPENDENT METHOD TO MEASURE THE THICKNESS OF COATINGS DEPOSITED ON CURVED OBJECTS MOVING AT HIGH RATES

机译:独立于物体位置的方法来测量高速运动的弯曲物体上沉积的涂层的厚度

摘要

Methods and apparatus for measuring a thickness of a coating on an moving object are provided. Light is directed toward the object at a predetermined location on the object such that a portion of the light interacts with the object. A I D and/or 2D maximum intensities for at least one wavelength channel is captured that is produced by the portion of the light interacting with the object. A measured average intensity of the wavelength channel and/or intensities and their arithmetic derivatives of multi wavelength channel geometries is converted into I D (averaged) and/or 2D thickness values. Based on these values an acceptability of the coating is evaluated and thickness calculated.
机译:提供了用于测量运动物体上的涂层的厚度的方法和设备。光在物体上的预定位置处被引导向物体,使得一部分光与物体相互作用。捕获至少一个波长通道的ID和/或2D最大强度,该强度是由与物体相互作用的那部分光产生的。将测得的波长通道的平均强度和/或强度以及它们的多波长通道几何形状的算术导数转换为I D(平均)和/或2D厚度值。基于这些值,评估涂层的可接受性并计算厚度。

著录项

  • 公开/公告号EP3400430A4

    专利类型

  • 公开/公告日2019-11-06

    原文格式PDF

  • 申请/专利权人 ARKEMA INC.;

    申请/专利号EP20170736210

  • 申请日2017-01-04

  • 分类号G01B11/06;G01N21/84;G01N21/90;

  • 国家 EP

  • 入库时间 2022-08-21 12:30:02

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