PRISM-COUPLING SYSTEMS AND METHODS FOR CHARACTERIZING LARGE DEPTH-OF-LAYER WAVEGUIDES

摘要

Prism-coupling systems and methods for characterizing large depth-of-layer waveguides are disclosed. The systems and methods utilize a coupling prism having a coupling angle having a maximum coupling angle max at which total internal reflection occurs. The prism angle is in the range 0.81max0.99max. This configuration causes the more spaced-apart lower-order mode lines to move closer together and the more tightly spaced higher-order mode lines to separate. The adjusted mode-line spacing allows for proper sampling at the detector of the otherwise tightly spaced mode lines. The mode-line spacings of the detected mode spectra are then corrected via post-processing. The corrected mode spectra are then processed to obtain at least one characteristic of the waveguide.