MEASURING DEVICE AND METHOD FOR MEASURING TWO OR THREE-DIMENSIONAL FILM TOPOGRAPHY AND METHOD FOR RECOGNISING IN-LINE PATTERNS IN TWO OR THREE-DIMENSIONAL FILM TOPOGRAPHY

摘要

The invention relates to the detection and use of film topography (23) of a film web (13, 40, 51) produced in blow film or casting film methods for improving the quality of the film web (13, 40, 51). In particular, film topography (23) can be quantitatively detected using said the invention. In another aspect of the invention, the film topography (23) is analysed using a pattern recognition algorithm and is optionally allocated an error image (50). This information is used in order to improve the quality of the film web (13, 40, 51) by controlling action recommendations dependent on the error image and to quantitatively detect the flatness of a film web (13, 40, 51). The invention also relates to an influencing element (30) for influencing the properties of a film web (13, 40, 51) in the position where the film topography (23) is determined.