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DETERIORATION DIAGNOSIS APPARATUS, DETERIORATION DIAGNOSIS METHOD, AND DETERIORATION DIAGNOSIS PROGRAM

机译:劣化诊断装置,劣化诊断方法和劣化诊断程序

摘要

In a deterioration diagnosis device (101), a calculation unit (105) estimates a performance of an apparatus during actual operation under a same environmental condition as an environmental condition at a testing time based on operation data (201) including a performance value obtained by measuring a performance of an apparatus during the actual operation, and one or more condition value indicating an environmental condition during the actual operation. The calculation unit (105) calculates a correction factor being a ratio between the performance value obtained by estimation, and a performance value obtained by testing a performance of the apparatus before deterioration. The diagnosis unit (107) compares a performance value obtained by testing a performance of the apparatus after deterioration with a product of a performance value included in new operation data (201) and the correction factor so as perform a deterioration diagnosis of the apparatus.
机译:在劣化诊断设备(101)中,计算单元(105)基于包括通过获得的性能值的操作数据(201),在与测试时的环境条件相同的环境条件下,在实际操作期间估计设备的性能。在实际操作期间测量设备的性能,以及指示实际操作期间的环境条件的一个或多个条件值。计算单元(105)计算校正因子,该校正因子是通过估计获得的性能值与通过在劣化之前测试设备的性能而获得的性能值之间的比率。诊断单元(107)将通过测试劣化之后的设备的性能而获得的性能值与新操作数据(201)中包括的性能值和校正因子的乘积进行比较,以执行设备的劣化诊断。

著录项

  • 公开/公告号EP3531036A1

    专利类型

  • 公开/公告日2019-08-28

    原文格式PDF

  • 申请/专利权人 MITSUBISHI ELECTRIC CORPORATION;

    申请/专利号EP20160921558

  • 发明设计人 TSUJIMURA TATSUNORI;

    申请日2016-11-21

  • 分类号F24F11/30;

  • 国家 EP

  • 入库时间 2022-08-21 12:27:22

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