APPARATUS AND METHOD FOR IN SITU ANALOG SIGNAL DIAGNOSTIC AND DEBUGGING WITH CALIBRATED ANALOG-TO-DIGITAL CONVERTER

摘要

An integrated circuit (IC) chip includes an on-chip analog signal monitoring circuit for monitoring a set of analog signals generated by one or more mixed signal cores within the IC chip, converting the analog signals into digital signals, storing the digital signals in an on-chip memory, and providing the digital signals to a test equipment upon request. The analog signal monitoring signal includes an on-chip reference generator for generating precise voltages and/or currents, a switching network for routing a selected reference signal to an analog-to-digital converter (ADC) for calibration purpose and for routing a selected analog signal from one of the mixed signal cores to the ADC for digitizing purposes. The IC chip further includes an on-chip memory for storing the digitized analog signals for subsequent accessing by a test equipment for analysis. The IC chip includes a digital analog test point (ATP) for outputting the digitized analog signals.