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COMPENSATING FOR DEGRADATION OF ELECTRONICS DUE TO RADIATION VULNERABLE COMPONENTS

机译:补偿易受辐射辐射影响的电子的降解

摘要

Techniques to compensate non-radiation hardened components (228) for changes or degradation in performance that result from exposure to radiation. During testing and modeling phase, a component's performance may be characterized as a result of the exposure to radiation. In some examples, some performance characteristics, such as voltage response, frequency response, gain, leakage or other characteristics, may change as the component's exposure to an amount of radiation increases. During normal operation, a system may include one or more devices that measure the amount of radiation to which the system may be subjected, such as a radiation dosimeter (232). The system may compensate the non-radiation hardened component (228) based on the amount of radiation received the known component performance change caused by radiation as determined during the modeling phase.
机译:补偿非辐射硬化部件(228)因暴露于辐射而导致性能变化或退化的技术。在测试和建模阶段,可以通过暴露于辐射来表征组件的性能。在一些示例中,某些性能特征(例如电压响应,频率响应,增益,泄漏或其他特征)可能会随着组件对辐射量的增加而改变。在正常操作期间,系统可以包括一个或多个测量该系统可能受到的辐射量的设备,例如辐射剂量计(232)。该系统可以基于在建模阶段确定的,由辐射导致的已知部件性能变化的接收到的辐射量,来补偿非辐射硬化部件(228)。

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