首页> 外国专利> APPEARANCE INSPECTION SYSTEM, SETTING DEVICE, IMAGE PROCESSOR, METHOD FOR SETTING, AND PROGRAM

APPEARANCE INSPECTION SYSTEM, SETTING DEVICE, IMAGE PROCESSOR, METHOD FOR SETTING, AND PROGRAM

机译:外观检查系统,设置设备,图像处理器,设置方法和程序

摘要

To provide an appearance inspection system which can save a designer labors for setting the conditions for imaging when the designer is sequentially imaging a plurality of inspection target positions on a target object.SOLUTION: The appearance inspection system includes an imaging condition determination unit and a route determination unit. The imaging condition determination unit determines a plurality of candidates of conditions for imaging including the relative position between a workpiece and an imaging device for at least one of a plurality of inspection target positions. The route determination unit determines a changing route in the imaging conditions for sequentially imaging the inspection target positions by selecting one of the candidates of imaging conditions to satisfy a predetermined requirement.SELECTED DRAWING: Figure 1
机译:提供一种外观检查系统,该外观检查系统可以节省设计者的劳力,以便当设计人员对目标对象上的多个检查目标位置进行连续成像时,可以设置成像条件。确定单位。成像条件确定单元针对多个检查目标位置中的至少一个,确定包括用于工件和成像装置之间的相对位置的成像条件的多个候选。路线确定单元确定摄影条件中的变化路线,以通过选择满足预定要求的多个摄影条件候选来依次对检查对象位置进行摄影。

著录项

  • 公开/公告号JP2019158499A

    专利类型

  • 公开/公告日2019-09-19

    原文格式PDF

  • 申请/专利权人 OMRON CORP;

    申请/专利号JP20180044034

  • 发明设计人 KATO YUTAKA;

    申请日2018-03-12

  • 分类号G01N21/89;

  • 国家 JP

  • 入库时间 2022-08-21 12:25:09

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号