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MAGNIFICATION INSPECTION WORK, MAGNIFICATION INSPECTION METHOD, AND OPTICAL MEASURING DEVICE

机译:放大检查工作,放大检查方法和光学测量设备

摘要

PROBLEM TO BE SOLVED: To provide a magnification inspection work, a magnification inspection method, and an optical measuring device, which allow a user to accurately and easily set magnification of a lens.;SOLUTION: An inspection pattern 42 for a magnification inspection work includes a reference line 43 in a straight line passing through a reference point co, and a spiral part 44 extended spirally from the reference point co. A magnification inspection work is fitted to an optical measuring device, an inspection image including an inspection pattern is detected by the optical measuring device, an inspection circle 45 in a radius equal to n pieces of integer of a pixel size dp is drawn on the detected inspection image, an intersection cc of the inspection circle 45 and the spiral part 44 is detected by the inspection image, an angle θc relative to the reference line 43 with the reference point co of the intersection cc as a center is detected, distance rc between the intersection cc and the reference point co on the inspection pattern 42 is calculated from the detected angle θc, and magnification of an objective lens is calculated from the calculated distance rc, a number-of-pixels n of the radius of the inspection circle 45, and the pixel size dp of the optical measuring device.;SELECTED DRAWING: Figure 3;COPYRIGHT: (C)2019,JPO&INPIT
机译:解决的问题:提供放大检查工作,放大检查方法和光学测量装置,以使用户能够准确且容易地设置透镜的放大倍率。解决方案:放大检查工作的检查图案42包括:通过基准点co的直线上的基准线43和从基准点co螺旋状延伸的螺旋部44。将放大检查工作装配到光学测量设备上,通过光学测量设备检测包括检查图案的检查图像,在检测到的对象上绘制半径等于像素尺寸dp的n个整数的检查圆45。检查图像,通过检查图像检测检查圆45与螺旋部44的交点cc,检测以交点cc的基准点co为中心的,相对于基准线43的角度θc,两者之间的距离rc根据检测到的角度θc计算出检查图案42上的交点cc和基准点co,并根据计算出的距离rc,检查圆45的半径的像素数n来计算物镜的倍率。 ;以及光学测量设备的像素尺寸dp 。;选定的图纸:图3;版权:(C)2019,JPO&INPIT

著录项

  • 公开/公告号JP2019100795A

    专利类型

  • 公开/公告日2019-06-24

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP20170230204

  • 发明设计人 ISHIYAMA TAKU;

    申请日2017-11-30

  • 分类号G01B11/02;

  • 国家 JP

  • 入库时间 2022-08-21 12:24:37

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