PROBLEM TO BE SOLVED: To provide a technique that models a cause-effect relationship between manufacturing time data and quality data differing in sampling frequency in a form verifiable with knowledge concerning a physical cause-effect relationship to make it easier to reconstruct.SOLUTION: Provided is a yield prediction device comprising: a representative value calculation unit for calculating a representative value using operating performance record data of a manufacturing device of a product that includes a plurality of variables; a nested network estimation unit for estimating a nested network that is a nested relation between object variables represented by a representative value for each representative value in accordance with the presence of a predetermined cause-effect relation and the hierarchical relation of variables; a prediction simulation unit for simulating prediction of quality data by a prescribed resolution using the nested network; and an output information generation unit for generating output information that shows the cause-effect relation between variables and quality data using the result of prediction simulation.SELECTED DRAWING: Figure 1
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